Title:
Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method.
Author(s):
Shen, Yongxing, Barnett, David M., and Pinsky, Peter M
Journal:
Engineering Analysis with Boundary Elements
, Volume 32
, Number 682-691
Date Published:
2008
Title:
A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method
Author(s):
Shen, Yongxing, Lee, Minhwan, Lee, Wonyoung, Barnett, David M., Pinsky, Peter M., and Prinz, Friedrich B.
Journal:
Nanotechnology
, Volume 19
, Number 035710
Date Published:
2008
Title:
Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations
Author(s):
Shen, Yongxing, Barnett, David M., and Pinsky, Peter M.
Journal:
Review of Scientific Instruments
, Volume 79
, Number 023711
Date Published:
2008
Title:
Analytic perturbation solution to the capacitance system between a hyberboloidal tip and a rough surface.
Author(s):
Shen, Yongxing, Barnett, David M., and Pinsky, Peter M.
Journal:
Applied Physics Letters
, Volume 92
, Number 134105
Date Published:
2008
Title:
The Displacement Field of a Triangular Dislocation Loop - a Correction with Commentary
Author(s):
Barnett, D. M. and Balluffi, R. W.
Journal:
Phil. Mag. Letters
, Volume 87
, Number 12
Date Published:
2007
Title:
Integral equation modeling of electrostatic interactions in atomic force microscopy
Author(s):
Shen, Yongxing, Barnett, David M., and Pinsky, Peter M.
Journal:
C. Constanda and S. Potapenko (eds.), Integral Methods in Science and Engineering: Techniques and Ap
, Number 237-246
Date Published:
2007
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